Quality Reliability Technology Inc. (QRT)

About

QRT is a leading-edge solution provider in reliability testing and failure analysis. Reliability has become an indispensable design consideration in addition to performance, cost, power, and TTM (Time-To-Market ) for microelectronics devices and systems in recent years. QRT provides unmatched services and solutions for reliability tests and failure analysis.
At QRT, we have state-of-the-art, in-house labs and experienced teams of reliability engineers, technical experts, and researchers. To render uninterrupted services, QRT has a network of domestic and overseas labs operating globally. The SmartLab is our latest addition to QRT's SmartFactory infrastructure, through which our customers can view and track the progress of their requested services remotely by a world wide web and mobile apps.
We provide solutions and expertise in:
• Reliability / High Temperature Operation Life (HTOL) Test
• Mechanical Test
• Highly Accelerated Stress Test (HAST)
• Highly Accelerated Life Test (HALT)
• LED, CIS, MEMS Device Reliability Test
• Failure Analysis and Highresolution Imaging
• Material Analysis and Circuit Modification
• Chemical and Forensic Analysis
• Reverse Engineering
• Radiation Test for SoC, Memory and Power Device
We at QRT provide globally accepted and recognized Test Certification which is fully compliant with various international safety and reliability standards, such as ISO 26262-2018 Functional Safety and AEC Q100 for Electric/Electronic parts for automotive industries. We also have a dedicated team of highly experienced engineers and technologists to offer technical training and educational services in the U.S, China, and Korea.

Keywords

cis amp led test, surface nano structural analysis, organic inorganic chemical analysis, fib circuit modification, alpha measurement, esd test, mechanical test, iso26262 qualification certification, reverse engineering, memory test, test certification, ssd test, rd device test, rf device, reverse engineering forensic analysis, organic amp inorganic chemical analysis, apha measurement, high temperature life test, 3d xray imaging, failure analysis, electrical stress test, see mitigation solutions, radiation test, surface amp nano structural analysis, obirchthemosphemos, material test analysis, dram, flash, chemical amp forensic analysis, ddic, reverse engineering amp forensic analysis, material test amp analysis, cis led test, accelerated reliability operating life test, see test analysis, esd tests, high temperature operating life test, single event effect test, see test amp analysis

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