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We are a technology-based company that wants to be a worldwide leadership in field of Atomic Force Microscopy (AFM) probe, especially in Tip Enhanced Raman Spectroscopy (TERS) and related technologies such as AFM-IR, nano-IR and s-SNOM. We will achieve this goal by means of a strong R&D focused to market together with excellent alliances with the key actors in each sector. Our mission is the design, development, scale-up and production of high value tips for applications for SPM (Scanning Probe Microscopy) methods in general, and particularly for AFM systems, based on a patented technology that allows us create innovative tips morphologies from nano-structures created by combination of different nanoparticles with controlled size and chemical composition.
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nanotechnology, ters, failure analysis, efm, life sciences, afmir, semiconductor, nanoftir, scattering snom, afm, ssnom, materials science, rd, nanoir, kpfm, rampd, mems characterization
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