IONTOF

About

IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS).
Founded as a classical spin-off of the University of Münster, IONTOF has meanwhile become the technological leader in the field of TOF-SIMS and LEIS instrumentation.
The company was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialise the original research carried out by Prof. Benninghoven and his team at the University of Muenster in Germany from the early 80's. Since the technique became commercially viable IONTOF has made many product improvements and more than 400 instruments are in operation in industrial and academic laboratories worldwide.
Today, the IONTOF group consists of four different companies. The IONTOF GmbH, which sells, produces and services all IONTOF analytical instruments. The IONTOF Technologies GmbH which is in charge of all R&D projects. The subsidiaries IONTOF USA and IONTOF Japan which were founded for sales and after sales service in the United States (founded 2000) and Japan (founded 2022).

IONTOF GmbH
Heisenbergstr.15
48149 Münster
Germany
www.iontof.com

Registergericht:
Amtsgericht Münster, HRB 10680
Geschäftsführer:
Dr. Ewald Niehuis

Keywords

mass spectrometry imaging, tofsims, leis, msi, surface analysis, ion beam technology, low energy ion scattering, secondary ion mass spectrometry, sims

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